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MEMS Test Handler "ULTRA P"

Ideal for measuring MEMS devices! Also compatible with measurements in temperature environments.

"ULTRA P" is a handler developed for the final testing of MEMS devices such as accelerometers and gyroscopes. By using a unique transport method, it achieves simultaneous measurements of up to 96 sites, enabling low-temperature and high-temperature measurements, as well as 6DOF (3 positions, 3-axis gyroscope) measurements. Additionally, we have prepared a measurement unit called "ULTRA L" that allows for manual measurements for research and development purposes. 【Features】 ■ Simultaneous measurement of many units (up to 96 DUT) ■ High-precision temperature control (within ±1℃) ■ Measurement at 60OF is possible ■ Achieves over 20,000 UPH ■ Magnetic testing (optional) is available *For more details, please refer to the catalog or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment
  • MEMS Test Handler

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